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Nov 6

Autoformalizer with Tool Feedback

Autoformalization addresses the scarcity of data for Automated Theorem Proving (ATP) by translating mathematical problems from natural language into formal statements. Efforts in recent work shift from directly prompting large language models to training an end-to-end formalizer model from scratch, achieving remarkable advancements. However, existing formalizer still struggles to consistently generate valid statements that meet syntactic validity and semantic consistency. To address this issue, we propose the Autoformalizer with Tool Feedback (ATF), a novel approach that incorporates syntactic and consistency information as tools into the formalization process. By integrating Lean 4 compilers for syntax corrections and employing a multi-LLMs-as-judge approach for consistency validation, the model is able to adaptively refine generated statements according to the tool feedback, enhancing both syntactic validity and semantic consistency. The training of ATF involves a cold-start phase on synthetic tool-calling data, an expert iteration phase to improve formalization capabilities, and Direct Preference Optimization to alleviate ineffective revisions. Experimental results show that ATF markedly outperforms a range of baseline formalizer models, with its superior performance further validated by human evaluations. Subsequent analysis reveals that ATF demonstrates excellent inference scaling properties. Moreover, we open-source Numina-ATF, a dataset containing 750K synthetic formal statements to facilitate advancements in autoformalization and ATP research.

  • 11 authors
·
Oct 8

A Benchmark Time Series Dataset for Semiconductor Fabrication Manufacturing Constructed using Component-based Discrete-Event Simulation Models

Advancements in high-computing devices increase the necessity for improved and new understanding and development of smart manufacturing factories. Discrete-event models with simulators have been shown to be critical to architect, designing, building, and operating the manufacturing of semiconductor chips. The diffusion, implantation, and lithography machines have intricate processes due to their feedforward and feedback connectivity. The dataset collected from simulations of the factory models holds the promise of generating valuable machine-learning models. As surrogate data-based models, their executions are highly efficient compared to the physics-based counterpart models. For the development of surrogate models, it is beneficial to have publicly available benchmark simulation models that are grounded in factory models that have concise structures and accurate behaviors. Hence, in this research, a dataset is devised and constructed based on a benchmark model of an Intel semiconductor fabrication factory. The model is formalized using the Parallel Discrete-Event System Specification and executed using the DEVS-Suite simulator. The time series dataset is constructed using discrete-event time trajectories. This dataset is further analyzed and used to develop baseline univariate and multivariate machine learning models. The dataset can also be utilized in the machine learning community for behavioral analysis based on formalized and scalable component-based discrete-event models and simulations.

  • 4 authors
·
Aug 17, 2024